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Fais fab roj teeb pob BMS Test System (BAT-NEHP-36K300-V004)
Lub kaw lus tsim nyog rau cov cuab yeej hluav taws xob, cov cuab yeej hauv vaj, lub tsheb kauj vab hluav taws xob, cov khoom siv hluav taws xob thaub qab, thiab lwm yam. Nws yog tsim los rau kev sib koom ua ke ntawm cov yam ntxwv thiab kev tiv thaiv ntawm 4S-36S Li-ion roj teeb PCM.Nws txhawb nqa parameter download & sib piv, PCB calibration ntawm lub hwj chim tswj IC (txhawb 12C, HDQ, SMBUS thiab lwm yam customized raws tu qauv)
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Fais fab Roj Teeb Pob BMS Test System (BAT-NEBMS64S1000V400A-A)
Cov kab ke no yog qhov tsim nyog kuaj rau BMS ntawm 1S-64S roj teeb pob.Nws muaj LMU thiab BMCU module.Single analog cell voltage yog nyob rau hauv 5000mV / 3A.Modular tsim nrog txhua chassis muaj li ntawm 40 electroly cais ywj siab analog roj teeb.Parallel muaj nuj nqi.
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Notebook Li-ion Battery Pack PCM Test System
Nws yog PCM integrated test system, haum rau cov yam ntxwv thiab kev tiv thaiv ntawm PCM nyob rau hauv phau ntawv Li-ion roj teeb, uas yog tsuas yog rau parameter download, calibration thiab tiv thaiv muaj nuj nqi xeem ntawm TI Corporation Gauge Gauge IC (BQ20Z45, BQ20Z75, BQ28Z610 , BQ3050, BQ3055, BQ3060, BQ40320, BQ40Z55, BQ40Z50, BQ30Z55, BQ34Z100, BQ9000, BQ40Z551, BQ27546, BQ277742, BQ27774,
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Nws yog ib tug ceev tester siv rau qhov yooj yim thiab kev tiv thaiv yam ntxwv kev ntsuam xyuas ntawm 1-xaim PCM nyob rau hauv 1S8 & 2S L-ion roj teeb pob.Cov IC siv tau suav nrog kev tswj hwm kev tswj hwm ntawm TI Corporation (xws li BQ27742, BQ277410 BQ28z610, BQ 27541, BQ 27545 BQ2753X).
Nws yog ib tug ceev tester siv rau qhov yooj yim thiab kev tiv thaiv yam ntxwv xeem ntawm 1-xaim PCM
hauv 1S8 & 2S L-ion roj teeb pob.Cov IC siv tau suav nrog cov kev tswj hwm ntawm TI
Corporation (xws li BQ27742, BQ277410 BQ28z610, BQ 27541, BQ 27545 BQ2753X).
